在外网ROG论坛找到暂时的解决办法:
1.BIOS - Advanced - SMART Settings - SMART Self Test,设置为Disabled
2.BIOS - Security - Secure Boot menu - Secure Boot Control,设置为Disabled
引用原文:
"The more I mess with this the more I think it is a BIOS bug dealing with the power cycling on reboot. My guess is that on reboots the BIOS power cycles to quickly and causes the system to not read the NVMe drive. That is why a cold power down can reacquire the drive. This could be the result of larger capacitors on these OEM Samsung drives, but this is all just a guess. At any rate I found a workaround that has been stable for me. (below)
Ok in BIOS under advanced changing the Smart self test setting to DISABLE. This allowed the update AE>CE install to complete with no BCD fails.
Another BIOS change I made was to turn off secure boot because it was preventing me from entering recovery environment (safe mode)
So with both of these settings changed in the BIOS I am back on the stock NVMe drive and all appears stable with no reboot BCD errors."
引用链接:
https://rog.asus.com/forum/showthread.php?92349-Windows-Creator-Update-Installation-Failure-on-GL502VS/page10&p=648888#post648888